by Luca Lutterotti, 1997-2003

actual version: WebStart and standalone application version 1.999 (3 December 2003) 

MAUD stands for Material Analysis Using Diffraction. It is based on the RITA/RISTA method by H.-R. Wenk, S. Matthies and L. Lutterotti (see references and picture). Other researchers contributing to the development of the methodology include M. Ferrari (micromechanic), N. C. Popa (for the Line Broadening), R. W. Grosse-Kunstleve with SgInfo, L. Cont (Java development). Special thanks go also to S. Gialanella and the Center for Materials Science of the Los Alamos National Laboratory for supporting the work.

A manual will be available soon, at the present we are putting online the tutorials that may help on beginning with the program.

To download the program choose the Web Start (Maud Web Start) or standalone version (Maud installers) from the menu on top of on the left panel

M. Ferrari and L. Lutterotti, "Method for the simultaneous determination of anisotropic residual stresses and texture by X-ray diffraction", J. Appl. Phys., 76 (11), 7246-55, 1994.

H.-R. Wenk, S. Matthies and L. Lutterotti, "Texture analysis from diffraction spectra", Mater. Sci. Forum, 157-162, 473-480, 1994.

L. Lutterotti, P. Polonioli, P. G. Orsini and M. Ferrari, "Stress and texture analysis of zirconia coatings by XRD total pattern fitting", in ASME Materials and Design Technology 1994, Ed. T. J. Kozik, ASME, 15-20, 1994.

M. Ferrari, L. Lutterotti, S. Matthies, P. Polonioli, H. -R. Wenk, "New opportunities in the texture and stress field by the whole pattern analysis", Mat. Sci. Forum, vols 228-231, pp. 83-88, (1996).

S. Matthies, L. Lutterotti, H. -R. Wenk, "Advances in Texture Analysis from Diffraction Spectra", J. Appl. Cryst., 30, 31-42, (1997).

L. Lutterotti, S. Matthies, H.-R. Wenk, A.J. Schultz and J. Richardson, "Texture and structure analysis of deformed limestone from neutron diffraction spectra", J. Appl. Phys., 81[2], 594-600, (1997).

S. Matthies, L. Lutterotti and H. -R. Wenk, "Progress in combining Rietveld and QTA Algorithms on Advanced Level", Presented at ICOTOM 11, China, September 1996.

L. Lutterotti and S. Gialanella, "X-ray diffraction characterization of heavily deformed metallic specimens", Acta Mater., 46[1], 101-110, (1998).

L. Lutterotti, S. Matthies and H. -R. Wenk, "MAUD (Material Analysis Using Diffraction): a user friendly {Java} program for {Rietveld} Texture Analysis and more", Proceeding of the Twelfth International Conference on Textures of Materials (ICOTOM-12), Vol. 1, 1599, (1999).