version 2.3 by Luca Lutterotti, 1997-1999
News
After one year I have update Rietquan 2.2 to version 2.3.
In the new version the line broadening method has changed from the Lutterotti et al. method (see references) to the Delhez, De Keiser and Mittemejer (Rietveld book) method. The difference between the two methods is quite small but in this manner the computing routine is more stable and you will not get any more overflow errors.
The installer now is in english!! Check out the readme for all the changes. An italian version of the program is available in this page.
6 April 1999. This is the last revision and update of the program because any improvement will go in the new Maud program. Rietquan will remain as a very easy and small program for quantitative phase analysis. If you need something more check Maud.
Characteristics of the program:
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Rietveld crystal refinement for one or more phases |
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Quantitative phase analysis using the Rietveld procedure for crystalline phases |
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Quantitative phase analysis of the silica-glass and amorph phases |
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Microstructural analysis of crystallite size and r.m.s. microstrain |
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Customizable database of structures (coming with some of the principal phases already included) |
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Automatic mode of analysis using an "expert system" for refinement strategy. |
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Import CIF files exported by the ICSD database software |
Download a screen shot of Rietquan in action.
System requirements:
PC running Windows 95 or NT.
Getting the program:
You can download the zip archive for the installation of the program Rietquan 2.3:Then follow the instructions of the readme.txt file for the installation. Be sure to download this readme file and save it, it is not contained in the installation package and contain important notices. The package will install a full copy of the program that run as a demo until you register your copy (for academic is free). For more information how to register the program contact Luca.Lutterotti.
Last update: 17 April 1998. Check the readme.txt file for what new.
Bugs or problem must be reported directly to the author, Luca.Lutterotti.
Registration (free for academic and public research center users)
The program will ask the registration the first time the user will try to compute or refine a spectrum using his own datafile (not the ones provided as tutorial examples). The user must annotate the two numbers (license and program IDs) reported in registration dialog and send them to Luca.Lutterotti to receive the personalized password within a resonable time (hoping the author is not in vacation). The registration dialog box can be closed. It will re-appear any time the computation or refinement action is choosed.
References:
L. Lutterotti & P. Scardi, "Simultaneous structure and size-strain refinement by the Rietveld method", J. Appl. Cryst., 23, 246-252, 1990.
L. Lutterotti, P. Scardi & P. Maistrelli, "LS1 - A computer program for simultaneous refinement of material structure and microstructure". J. Appl. Cryst., 25, 459-462, 1992.
P. Scardi, L. Lutterotti & P. Maistrelli, "Experimental Determination of the Instrumental Broadening in the Bragg-Brentano Geometry". Powder Diffraction., 9 (3), pp.180-186, 1994.
L. Lutterotti, R. Ceccato, R. Dal Maschio and E. Pagani, "Quantitative analysis of silicate glass in ceramic materials by the Rietveld method", Mater. Sci. Forum. 278-281, pp. 93-98, 1998.
For more about my research work check out the complete list of publications.
Revised: April 6, 1999
© 1997 Luca Lutterotti
