Peak Profiling: Crystallite size and strain using Fundamental Parameters peak profiling in XFIT

• Example of Fundamental parameters (convoluting in the geometry elements of the diffractometer) to profile peaks and also provide size and strain information (though be careful on how you intepret this)

• Tutorial at:

  • http://www.ccp14.ac.uk/tutorial/xfit-95/fun1.htm

• Available Fundamental Parameters Peak Profiling and Rietveld software:

• XFIT (no longer maintained)

  • http://www.ccp14.ac.uk/tutorial/xfit-95/xfit.htm

• Topas (Commercial - sequel to XFIT)

  • http://www.bruker.com

• BGMN (Commercial - academic version is downloadable)

  • http://www.bgmn.de

Previous slide

Next slide

Back to first slide

View graphic version