Y.Epelboin, V.Mocella and A.Soyer
Optical characteristics of synchrotron sources and their influence in the simulation of X-ray topographs.

Phil. Trans. R. Soc. Lond. A (1999) 357, 2731-2739

The optical characteristics of third-generation synchrotron sources and their influence on the simulation of X-ray topographs for various experimental settings, both for the Laue and Bragg case, are discussed. A new generation of simulation programs that allow easy modification of the model of deformation is described.


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