M.Pilard, Y.Epelboin, A.Soyer
Fourier Filtering of Synchrotron White-Beam Topographs.

Journal of Applied Crystallography (1995) 28, 279-288

Numerical image treatment has been used for the enhancement and the analysis of synchrotron white-beam topographs. Images are recorded either during the experiment by means of an X-ray-sensitive camera or after the experiment from photographic films. Filters are designed to avoid artefacts such as the Gibbs effect. Filtering has been applied to the study of the propagation of surface acoustic waves in piezoelectric materials and ferromagnetic domains in Fe-Si crystals, illustrating the interest of Fourier filtering for a deep analysis of X-ray topographs.


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