Features:

• Pixel related background determination using only statistical parameters

• No limits for reflection enlargement

• Matrix free integration of all significant reflection intensities

• Indexation using gnomonic projection of difference vectors

• Fix-Metric orientation search

• Beam callibration

• Refinement of Orientation and/or Metric in fix crystall system

• Twin orientation and integration into hklf5-file

• Shelxl-hklf4 file generation

• Free rotation axis orientation (not only horizontal or vertical)

• Reciprocal spacemap generation

• Indexation an refinement of quasicrystalls (in preparation)

• Many data investigation tools

• German/English translations (depends on LANG environment variable)

Supported Image Plates:

• MAR 180

• MAR 300

• MAR 345

• MAR CCD

• STOE IPDS I (binary only)

• STOE IPDS II (binary only)

• More to come (Bruker, Quantum 4, EDF)