Match! Function List

• Fast single and multiple phase identification from powder diffraction data
• Use the ICDD PDF-2 or PDF-4 databases and/or your own diffraction data or patterns calculated from crystal structure data (e.g. CIF files) in phase identification
• Comfortable user database manager for easy maintenance of user data (add/import/edit/delete/sort entries)
• Fully integrated handling of your own diffraction data with PDF data (search-match, retrieval, data viewing)
• Automatic residual searching with respect to identified phases
• Automatic raw data processing: α2-stripping, background subtraction, peak search, profile fitting, error correction
• Automatic optimization of peak searching sensitivity
• Fitting of all (or selected) peak parameters to exp. profile data
• Comfortable manual editing of peaks (add/shift/delete/fit) using mouse or keyboard
• Semi-quantitative analysis (Reference Intensity Ratio method)
• Straight-forward usage of additional knowledge (composition, PDF subfiles, crystallographic data, color, density etc.)
• Integrated database retrieval system and viewer for PDF and user datasheets
• Multiple step undo/redo
• Support for new PDF entry numbers (9 digits)
• User-configurable automatic operation
• Full parameter control with instant rearrangement of the results list
• Automatic d-value shifting during search-match process (optionally)
• Intensity contribution to figure-of-merit can be reduced for preferred-orientation cases
• Comfortable graphical and tabular comparison of peak data and candidate patterns
• Mouse-controlled pattern graphics zooming and tracking
• User-configurable HTML-reports
• Online update (automatic or manual)
• Supported diffraction data file formats:
  • ASCII profile (start, step, intensities or 2 columns)
  • Bruker/Siemens raw data (old and new) (*.raw)
  • Bruker/Siemens DIFFRAC AT peak data (*.dif)
  • DBWS (*.rfl, *.dat)
  • ENDEAVOUR peak list (2 columns: 2theta/d intensity; *.dif)
  • Inel raw data (*.dat)
  • Jade/MDI/SCINTAG raw data (*.mdi)
  • Philips/PANalytical peak data (*.udi)
  • Philips/PANalytical raw data (*.rd, *.udf)
  • Rigaku raw data (*.raw)
  • SCINTAG raw data (*.raw, *.rd)
  • Siemens (*.uxd)
  • Stoe raw data (*.raw)
  • Stoe peak data (*.pks)

  Please contact Crystal Impact if the file format you are using is not yet supported!

System requirements

• Personal Computer with Microsoft Windows 98, ME, NT 4.0, 2000 or XP operating system
• Reference pattern database (ICDD PDF-2 or PDF-4 (recommended)) and/or own powder diffraction patterns or crystal structure data (e.g. CIF files))
• Microsoft Internet Explorer 5.01 or higher
• 64 megabytes of RAM (128 megabytes recommended)
• Hard disk with minimum 600 MB of free disk space
• Graphics resolution of 1024 x 768 pixels with 32,768 colors ("High Color")