- Fast single and multiple phase identification from powder diffraction data based on ICDD PDF2 database
- Automatic residual searching with respect to already identified phases
- Searching of complete PDF2 database or subfile(s)
- Automatic raw data processing: α2-stripping, background subtraction, peak search,
error correction
- Comfortable manual editing of peaks (add/shift/delete) using mouse or keyboard
- Uses peak data and optionally raw (profile) data simultaneously
- Semi-quantitative analysis (Reference Intensity Ratio method)
- Integrated PDF2 database retrieval system and viewer for PDF2 datasheets
- Straight-forward usage of additional knowledge (composition, crystallographic data, color, density etc.)
- Explicit searching for entries with peaks at certain positions
|
- Multiple step undo/redo
- User-configurable automatic data processing
- Full parameter control with instant rearrangement of the results list
- Automatic d-value shifting during search-match process (optionally)
- Intensity contribution to figure-of-merit can be reduced for preferred-orientation cases
- Comfortable graphical and tabular comparison of peak data and candidate patterns
- Mouse-controlled pattern graphics zooming and tracking
- User-configurable HTML-reports
- Supported diffraction data file formats: Stoe (*.raw, *.pks), Philips/ PANalytical
(*.rd, *.udf, *.udi), Bruker/Siemens V3 (*.raw), Siemens (*.uxd), DBWS (*.rfl, *.dat),
ASCII profile (start, step, intensities or 2 columns), ENDEAVOUR peak list (2 columns:
2theta/d intensity; *.dif)
|
