BREADTH -- a PC program for analyzing diffraction-line broadening
A simple program for analyzing the diffraction line broadening is available. The program calculates domain size and strain from input integral breadths of at least two physically broadened diffraction-line profiles.
Besides the so-called simplified integral-breadth methods, the program calculates the root-mean-square strain and both surface- and volume-weighted domain sizes, together with the associated estimated standard deviations, according to the alternative integral-breadth method, which is equivalent to the Warren-Averbach approximation.
More information can be found in the papers Advances in X-Ray Analysis 39 (1997) 457 and Journal of Applied Crystallography 28 (1995) 244.
Download the self-extracting file BREADTH3.EXE. After you run it, seven files will be created:
README.1st, BREADTH.EXE, BREADTH.DOC, LJETIII.A4, LJETIII.LET, AG100L5.BRI, BREADTH.OUT. Please, read the README.1st file first.
BREADTH is a very basic program for analyzing diffraction line broadening. Please note that it requires the parameters of physically broadened line profile on input, that is, you have to correct for the influence of instrument (instrumental broadening) prior to the input in BREADTH. SHADOW is a program that can be used for that purpose, in case you don't have any similar program at hand. Download the self-extracting file SHADOW3.EXE and unpack it in the same way as BREADTH3.EXE and read the READ.ME and other text files first.
In case of any problems or questions, do not hesitate to contact me:
National Institute of Standards and Technology
Materials Science and Engineering Laboratory
325 Broadway
Boulder, CO 80303
Tel: 303-497-3006
Fax: 303-497-5030
E-mail: balzar@boulder.nist.gov
Bibliography:
D. Balzar, J. Appl. Cryst. 28 (1995) 244-245.
D. Balzar and H. Ledbetter, Adv. X-Ray Anal. 39 (1997) 457-464.
D. Balzar, J. Appl. Cryst. 25 (1992) 559-570.
D. Balzar and H. Ledbetter, J. Appl. Cryst. 26 (1993) 97-103.
D. Balzar, S. Popovic, J. Appl. Cryst. 29 (1996) 16-23.
D. Balzar, in Defect and Microstructure Analysis from Diffraction, edited by R.L. Snyder, H.J. Bunge, and J. Fiala, International Union of Crystallography Monographs on Crystallography No. 10 (Oxford University Press, New York, 1999) pp. 94-126. PREPRINT (PDF)
D. Balzar, P. W. Stephens, H. Ledbetter, E. T. Park, J. Routbort, Phys. Rev. B 59 (1999) 3414-3420. REPRINT (PDF)
D. Balzar, J. Res. Natl. Inst. Stand. Technol. 98 (1993) 321-353.
D. Balzar and H. Ledbetter, J. Mater. Sci. Lett. 11 (1992) 1419-1420.
D. Balzar, H. Ledbetter, and A. Roshko, Pow. Diffr. 8 (1993) 2-6.
Last updated on September 18, 2000